Yıldırım, M. Et Al. 2017. Investigation of structural, optical and dielectrical properties of Cu2WS4 thin film. Journal of Materials Science: Materials in Electronics , vol.28, no.9 , 6712-6721.

Yıldırım, M., Özel, F., Sarılmaz, A., Aljabour, A., & Patır, İ. H., (2017). Investigation of structural, optical and dielectrical properties of Cu2WS4 thin film. Journal of Materials Science: Materials in Electronics , vol.28, no.9, 6712-6721.

Yıldırım, Murat Et Al. "Investigation of structural, optical and dielectrical properties of Cu2WS4 thin film," Journal of Materials Science: Materials in Electronics , vol.28, no.9, 6712-6721, 2017

Yıldırım, Murat Et Al. "Investigation of structural, optical and dielectrical properties of Cu2WS4 thin film." Journal of Materials Science: Materials in Electronics , vol.28, no.9, pp.6712-6721, 2017

Yıldırım, M. Et Al. (2017) . "Investigation of structural, optical and dielectrical properties of Cu2WS4 thin film." Journal of Materials Science: Materials in Electronics , vol.28, no.9, pp.6712-6721.

@article{article, author={Murat Yıldırım Et Al. }, title={Investigation of structural, optical and dielectrical properties of Cu2WS4 thin film}, journal={Journal of Materials Science: Materials in Electronics}, year=2017, pages={6712-6721} }