DEMIR, L. Et Al. 2003. Angular dependence of L X-ray differential cross-section for In, Sn, Sb, and Te at 5.96 keV. JOURNAL OF TRACE AND MICROPROBE TECHNIQUES , vol.21, no.4 , 593-599.

DEMIR, L., Sahin, M., & SAHIN, Y., (2003). Angular dependence of L X-ray differential cross-section for In, Sn, Sb, and Te at 5.96 keV. JOURNAL OF TRACE AND MICROPROBE TECHNIQUES , vol.21, no.4, 593-599.

DEMIR, L, MEHMET ŞAHİN, And Y SAHIN. "Angular dependence of L X-ray differential cross-section for In, Sn, Sb, and Te at 5.96 keV," JOURNAL OF TRACE AND MICROPROBE TECHNIQUES , vol.21, no.4, 593-599, 2003

DEMIR, L Et Al. "Angular dependence of L X-ray differential cross-section for In, Sn, Sb, and Te at 5.96 keV." JOURNAL OF TRACE AND MICROPROBE TECHNIQUES , vol.21, no.4, pp.593-599, 2003

DEMIR, L. Sahin, M. And SAHIN, Y. (2003) . "Angular dependence of L X-ray differential cross-section for In, Sn, Sb, and Te at 5.96 keV." JOURNAL OF TRACE AND MICROPROBE TECHNIQUES , vol.21, no.4, pp.593-599.

@article{article, author={L DEMIR Et Al. }, title={Angular dependence of L X-ray differential cross-section for In, Sn, Sb, and Te at 5.96 keV}, journal={JOURNAL OF TRACE AND MICROPROBE TECHNIQUES}, year=2003, pages={593-599} }