Kanmaz, İ. Et Al. 2024. Analysis of CeO2/SiO2 double‑layer thin flm stack with antirefection effect for silicon solar cells. JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS , vol.35, no.1947 , 1-9.

Kanmaz, İ., Tomakin, M., & Üzüm, A., (2024). Analysis of CeO2/SiO2 double‑layer thin flm stack with antirefection effect for silicon solar cells. JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS , vol.35, no.1947, 1-9.

Kanmaz, İmran, MURAT TOMAKİN, And Abdullah Üzüm. "Analysis of CeO2/SiO2 double‑layer thin flm stack with antirefection effect for silicon solar cells," JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS , vol.35, no.1947, 1-9, 2024

Kanmaz, İmran Et Al. "Analysis of CeO2/SiO2 double‑layer thin flm stack with antirefection effect for silicon solar cells." JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS , vol.35, no.1947, pp.1-9, 2024

Kanmaz, İ. Tomakin, M. And Üzüm, A. (2024) . "Analysis of CeO2/SiO2 double‑layer thin flm stack with antirefection effect for silicon solar cells." JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS , vol.35, no.1947, pp.1-9.

@article{article, author={İmran Kanmaz Et Al. }, title={Analysis of CeO2/SiO2 double‑layer thin flm stack with antirefection effect for silicon solar cells}, journal={JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS}, year=2024, pages={1-9} }