AUGE, A. Et Al. 2012. Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films. PHYSICAL REVIEW B , vol.85, no.21 .

AUGE, A., TEICHERT, N., MEINERT, M., REISS, G., UUETTEN, A. H., Yuzuak, E., ... Dincer, I.(2012). Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films. PHYSICAL REVIEW B , vol.85, no.21.

AUGE, A. Et Al. "Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films," PHYSICAL REVIEW B , vol.85, no.21, 2012

AUGE, A. Et Al. "Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films." PHYSICAL REVIEW B , vol.85, no.21, 2012

AUGE, A. Et Al. (2012) . "Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films." PHYSICAL REVIEW B , vol.85, no.21.

@article{article, author={A. AUGE Et Al. }, title={Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films}, journal={PHYSICAL REVIEW B}, year=2012}