GÜL, F. 2018. A simplified method to determine carrier transport mechanisms of metal-oxide resistive random access memory (RRAM) devices. 2nd International Congress on Semiconductor Materials and Devices” (ICSMD-2018) , (Ardahan, Turkey).

GÜL, F., (2018). A simplified method to determine carrier transport mechanisms of metal-oxide resistive random access memory (RRAM) devices . 2nd International Congress on Semiconductor Materials and Devices” (ICSMD-2018), Ardahan, Turkey

GÜL, FATİH. "A simplified method to determine carrier transport mechanisms of metal-oxide resistive random access memory (RRAM) devices," 2nd International Congress on Semiconductor Materials and Devices” (ICSMD-2018), Ardahan, Turkey, 2018

GÜL, FATİH. "A simplified method to determine carrier transport mechanisms of metal-oxide resistive random access memory (RRAM) devices." 2nd International Congress on Semiconductor Materials and Devices” (ICSMD-2018) , Ardahan, Turkey, 2018

GÜL, F. (2018) . "A simplified method to determine carrier transport mechanisms of metal-oxide resistive random access memory (RRAM) devices." 2nd International Congress on Semiconductor Materials and Devices” (ICSMD-2018) , Ardahan, Turkey.

@conferencepaper{conferencepaper, author={FATİH GÜL}, title={A simplified method to determine carrier transport mechanisms of metal-oxide resistive random access memory (RRAM) devices}, congress name={2nd International Congress on Semiconductor Materials and Devices” (ICSMD-2018)}, city={Ardahan}, country={Turkey}, year={2018}}