O. Gorur Et Al. , "Sn diffusion coefficient and activation energy determined by way of XRD measurement and evaluation of micromechanical properties of Sn diffused YBa2Cu3O7-x superconducting ceramics," JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.24, no.8, pp.3063-3072, 2013
Gorur, O. Et Al. 2013. Sn diffusion coefficient and activation energy determined by way of XRD measurement and evaluation of micromechanical properties of Sn diffused YBa2Cu3O7-x superconducting ceramics. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.24, no.8 , 3063-3072.
Gorur, O., Ozturk, Y., Yildirim, G., Dogruer, M., & Terzioglu, C., (2013). Sn diffusion coefficient and activation energy determined by way of XRD measurement and evaluation of micromechanical properties of Sn diffused YBa2Cu3O7-x superconducting ceramics. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.24, no.8, 3063-3072.
Gorur, O. Et Al. "Sn diffusion coefficient and activation energy determined by way of XRD measurement and evaluation of micromechanical properties of Sn diffused YBa2Cu3O7-x superconducting ceramics," JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.24, no.8, 3063-3072, 2013
Gorur, O. Et Al. "Sn diffusion coefficient and activation energy determined by way of XRD measurement and evaluation of micromechanical properties of Sn diffused YBa2Cu3O7-x superconducting ceramics." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.24, no.8, pp.3063-3072, 2013
Gorur, O. Et Al. (2013) . "Sn diffusion coefficient and activation energy determined by way of XRD measurement and evaluation of micromechanical properties of Sn diffused YBa2Cu3O7-x superconducting ceramics." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.24, no.8, pp.3063-3072.
@article{article, author={O. Gorur Et Al. }, title={Sn diffusion coefficient and activation energy determined by way of XRD measurement and evaluation of micromechanical properties of Sn diffused YBa2Cu3O7-x superconducting ceramics}, journal={JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS}, year=2013, pages={3063-3072} }