Estimation of the section thickness and optical disector height with a simple calibration method

KORKMAZ A., Tumkaya L.

JOURNAL OF MICROSCOPY-OXFORD, cilt.187, ss.104-109, 1997 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 187
  • Basım Tarihi: 1997
  • Doi Numarası: 10.1046/j.1365-2818.1997.2180777.x
  • Dergi Adı: JOURNAL OF MICROSCOPY-OXFORD
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.104-109
  • Recep Tayyip Erdoğan Üniversitesi Adresli: Hayır

Özet

The distance between the upper and lower surfaces of a section (i.e. the section thickness) can be measured with a microcator or a shaft encoder. In the present report, an alternative simple method is described for estimating the section thickness where such equipment is not available. The basic principle of the method is based on a calibration method already described in the literature, The main difference is that it enables one to make more precise measurements. Provided that the calibration and measurements are made properly, this method can be used in estimating the section thickness, optical disector heights, and in particular in the determination of the thickness sampling fraction fur the optical fractionator.