Estimation of the section thickness and optical disector height with a simple calibration method


KORKMAZ A., Tumkaya L.

JOURNAL OF MICROSCOPY-OXFORD, vol.187, pp.104-109, 1997 (Journal Indexed in SCI) identifier identifier

  • Publication Type: Article / Article
  • Volume: 187
  • Publication Date: 1997
  • Doi Number: 10.1046/j.1365-2818.1997.2180777.x
  • Title of Journal : JOURNAL OF MICROSCOPY-OXFORD
  • Page Numbers: pp.104-109

Abstract

The distance between the upper and lower surfaces of a section (i.e. the section thickness) can be measured with a microcator or a shaft encoder. In the present report, an alternative simple method is described for estimating the section thickness where such equipment is not available. The basic principle of the method is based on a calibration method already described in the literature, The main difference is that it enables one to make more precise measurements. Provided that the calibration and measurements are made properly, this method can be used in estimating the section thickness, optical disector heights, and in particular in the determination of the thickness sampling fraction fur the optical fractionator.