Akademik Veri Yönetim Sistemi
JOURNAL OF POLYMER RESEARCH, cilt.33, sa.5, 2026 (SCI-Expanded, Scopus)
This study provides a comprehensive investigation of the structural, optical, and electrical properties of polymethyl methacrylate (PMMA)-based multilayer resistive structures incorporating metallic electrodes and ion-generating layers for emerging memory device applications. The fabricated PMMA/(Al/Ag, Sn/Cu) stacks represent a carefully engineered architecture in which PMMA serves as an insulating or electrolytic matrix, while the combined metallic layers aluminum with silver and tin with copper-function simultaneously as electrodes and active ion sources that enable current transport and resistive switching. The introduction of highly reflective metallic layers strongly influences the optical response of the composites, producing a marked reduction in transmittance, particularly in the PMMA/Al/Ag system. This reduction is associated with the optical behavior of silver, whose pronounced surface plasmon resonance significantly alters light-matter interactions. Fourier Transform Infrared Spectroscopy (FTIR) confirms the structural integrity of PMMA while revealing metal-induced modifications. UV-Vis analysis showed that the metallic multilayers strongly affect the optical response of the composites, leading to reduced transmittance, particularly in the PMMA/Al/Ag system. FTIR confirmed the structural integrity of PMMA and revealed characteristic absorption bands associated with metal-polymer interactions. In the PMMA/Sn/Cu composite, strong bands at 1730 cm(-)& sup1; and 1149 cm(-)& sup1; were assigned to C = O and C-O vibrations, respectively. Scanning Electron Microscopy (SEM) demonstrates that metallic nanoparticles significantly affect surface morphology, with Ag particles forming nanoscale clusters and Sn/Cu forming larger micron-sized structures. Atomic Force Microscopy (AFM) confirms uniform Ag nanoparticle coverage with an average diameter near 30 nm. X-ray Diffraction (XRD) reveals the predominantly amorphous structure of PMMA/Al and the partially crystalline nature of PMMA/Sn/Cu, reflecting the presence of metallic crystalline phases. Collectively, these multilayer composites exhibit favorable structural stability, tunable optical behavior, and conductive networks suitable for resistive random-access memory (RRAM). In a broader materials context, the understanding of such metal-polymer systems share conceptual parallels with processes used in ore characterization, mineral processing, and beneficiation, where structural control and material optimization are essential. Their combined polymer flexibility and metallic conductivity highlight their strong potential for next-generation non-volatile memory technologies.