Akademik Veri Yönetim Sistemi
OPTICAL MATERIALS, cilt.168, 2025 (SCI-Expanded, Scopus)
In this study, single layer CeO2, double layer CeO2/HfO2 and triple layer CeO2/HfO2/SiO2 thin films were successfully coated on crystalline silicon surface using spin coating method. The obtained results were characterized structurally, morphologically, and optically. Structural and morphological measurements confirmed that the thin films were successfully coated, while optical results showed that optical transmittance and antireflection effects were improved depending on the number of layers. From the reflectance analysis, the average reflectance value for uncoated Si was around 40 %, while it was recorded as 12.26 % for single layer CeO2, 8.86 % for double layer CeO2/HfO2 and 7.77 % for triple layer CeO2/HfO2/SiO2. In addition, the average reflectance results were applied to c-Si solar cell with the help of SCAPS software and power conversion efficiencies were calculated. While the efficiency in uncoated c-Si solar cell was 13.84 %, the efficiency increased to 20.16 % when single layer CeO2 thin film was applied. When double layer CeO2/HfO2 and triple layer CeO2/HfO2/SiO2 antireflective coatings were used, solar cell conversion efficiency of 20.97 % and 21.23 % was achieved, respectively.