Angular dependence of L X-ray differential cross-section for In, Sn, Sb, and Te at 5.96 keV

DEMIR L., Sahin M., SAHIN Y.

JOURNAL OF TRACE AND MICROPROBE TECHNIQUES, cilt.21, sa.4, ss.593-599, 2003 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 21 Sayı: 4
  • Basım Tarihi: 2003
  • Doi Numarası: 10.1081/tma-120025810
  • Dergi Adı: JOURNAL OF TRACE AND MICROPROBE TECHNIQUES
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.593-599
  • Recep Tayyip Erdoğan Üniversitesi Adresli: Hayır

Özet

The differential cross-sections of L X-ray induced in In, Sn, Sb, and Te have been measured at different angles from 94degrees to 170degrees at intervals of 9degrees. Measurement have been performed with a Si(Li) detector using 5.96 keV photons as the excitation source. It is seen from the results concerning heavy elements that Lalpha peaks show anisotropic emissionn while Lbeta and Lgamma peaks are emitted isotropically.