Angular dependence of L X-ray differential cross-section for In, Sn, Sb, and Te at 5.96 keV


DEMIR L., Sahin M. , SAHIN Y.

JOURNAL OF TRACE AND MICROPROBE TECHNIQUES, vol.21, no.4, pp.593-599, 2003 (Journal Indexed in SCI) identifier identifier

  • Publication Type: Article / Article
  • Volume: 21 Issue: 4
  • Publication Date: 2003
  • Doi Number: 10.1081/tma-120025810
  • Title of Journal : JOURNAL OF TRACE AND MICROPROBE TECHNIQUES
  • Page Numbers: pp.593-599

Abstract

The differential cross-sections of L X-ray induced in In, Sn, Sb, and Te have been measured at different angles from 94degrees to 170degrees at intervals of 9degrees. Measurement have been performed with a Si(Li) detector using 5.96 keV photons as the excitation source. It is seen from the results concerning heavy elements that Lalpha peaks show anisotropic emissionn while Lbeta and Lgamma peaks are emitted isotropically.