Angular dependence of L X-ray differential cross-section for In, Sn, Sb, and Te at 5.96 keV


DEMIR L., Sahin M., SAHIN Y.

JOURNAL OF TRACE AND MICROPROBE TECHNIQUES, vol.21, no.4, pp.593-599, 2003 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 21 Issue: 4
  • Publication Date: 2003
  • Doi Number: 10.1081/tma-120025810
  • Journal Name: JOURNAL OF TRACE AND MICROPROBE TECHNIQUES
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.593-599
  • Recep Tayyip Erdoğan University Affiliated: No

Abstract

The differential cross-sections of L X-ray induced in In, Sn, Sb, and Te have been measured at different angles from 94degrees to 170degrees at intervals of 9degrees. Measurement have been performed with a Si(Li) detector using 5.96 keV photons as the excitation source. It is seen from the results concerning heavy elements that Lalpha peaks show anisotropic emissionn while Lbeta and Lgamma peaks are emitted isotropically.