Analysis of CeO2/SiO2 double‑layer thin flm stack with antirefection effect for silicon solar cells


Kanmaz İ., Tomakin M., Üzüm A.

JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS, cilt.35, sa.1947, ss.1-9, 2024 (SCI-Expanded)

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 35 Sayı: 1947
  • Basım Tarihi: 2024
  • Doi Numarası: 10.1007/s10854-024-13245-5
  • Dergi Adı: JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Aerospace Database, Applied Science & Technology Source, Chemical Abstracts Core, Communication Abstracts, Compendex, Computer & Applied Sciences, INSPEC, MEDLINE, Metadex, Civil Engineering Abstracts
  • Sayfa Sayıları: ss.1-9
  • Recep Tayyip Erdoğan Üniversitesi Adresli: Evet