A simplified method to determine carrier transport mechanisms of metal-oxide resistive random access memory (RRAM) devices
Copy For Citation
GÜL F.
2nd International Congress on Semiconductor Materials and Devices” (ICSMD-2018), Ardahan, Turkey, 28 - 30 August 2018
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Publication Type:
Conference Paper / Summary Text
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City:
Ardahan
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Country:
Turkey
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Recep Tayyip Erdoğan University Affiliated:
No